1. The surface micro-topography was measured by a profilometer.

2. And the Scanning Electronic Microscope (SEM) and Laser Profilometer are adopted to obtain the specific structural information from cross-fracture and sample surface.

3. The optical profilometer provides a sub-micron measuring range with nanometer resolution and can be used to measure roughness or surface defects in real time.

4. A non-scanning, non-interferometric, three-dimensional (3D) optical profilometer based on geometric optics, critical angle principle, and the use of a charge-coupled device (CCD) camera is presented.

5. A large 3-D profilometer which is based on Fourier transform profilometry(FTP)is introduced in this paper.

6. Coordinate Measuring Machine, Optical Comparator, Leakage Test Machine, Profilometer, Roughness Measuring Machine, etc.

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7. A high-resolution laser profilometer that can be applied to on-line and on-machine measurements is introduced in the paper.

8. A non-contact surface profilometer with common-path interference and correlative processing is proposed.

9. In the stylus profilometer, a measuring mechanism with good performance is the key component, which guarantees"contact measuring"between the stylus and the surface of specimen.

10. The sensing mechanism of a novel stylus profilometer for topographic measurements of curved surfaces is presented.

11. An optical profilometer, based on the principle of the differential interference microscope, has been developed.

12. Compared with sputter crater depth results measured with surface profilometer, the converted depth results obtained by GD-OES were accurate and credible.

13. According to the above work, the detection system of vehicle bearing road roughness profilometer is designed.

14. The modulation principle, the theory of light coupled area, a optical profilometer with a single mode fiber probe and experiment results are detailed.

15. In this paper, a three-dimensional measuring system for surface asperities is described, in which a microcomputer is interfaced to a stylus profilometer.

16. The application of a low-voltage micro-displacement driving circuit and its control method on an optoelectronic profilometer are discussed.

17. In order to overcome the disadvantages of the pavement profilometer in use, the system of new-style pavement profilometer is presented.

18. The principle of inertia method and its application to the profilometer are demonstrated and described, including the details of the mechanical configuration and the electronic implementation used.

19. Based on the white-light interference, a vertical scanning white-light interfering profilometer was designed.